Electrical characteristics

The following tables list the electrical characteristics of the XBee/XBee-PRO XBee/XBee-PRO S1 802.15.4 (Legacy) RF Modules.

DC Characteristics (VCC = 2.8 - 3.4 VDC)

Symbol

Characteristic

Condition

Min

Typical

Max

Unit
VIL Input low voltage All Digital Inputs - - 0.35 * VCC V
VIH Input high voltage All Digital Inputs 0.7 * VCC - - V
VOL Output low voltage IOL = 2 mA, VCC >= 2.7 V - - 0.5 V
VOH Output high voltage IOH = -2 mA, VCC >= 2.7 V VCC - 0.5 - - V
IIIN Input leakage Current VIN = VCC or GND, all inputs, per pin - 0.025 1 µA
IIOZ High impedance leakage current VIN = VCC or GND, all I/O High-Z, per pin - 0.025 1 µA
TX Transmit current VCC = 3.3 V -

45 (XBee)

215, 140 (XBee-PRO, International)

- mA
RX Receive current VCC = 3.3 V -

50 (XBee)

55 (XBee-PRO)

- mA
PWR-DWN Power-down current SM parameter = 1 - <10 - µA

ADC characteristics (operating)

Symbol

Characteristic

Condition

Min

Typical

Max

Unit
VREFH VREF - analog-to-digital converter reference range   2.08 - VDDAD1 V
IREF VREF - reference supply current Enabled - 200 - µA
    Disabled or Sleep Mode - <0.01 0.02 µA
VINDC Analog input voltage2   VSSAD - 0.3   VDDAD + 0.3 V

  1. VDDAD is connected to VCC.

  2. Maximum electrical operating range, not valid conversion range.

ADC timing/performance characteristics1

Symbol

Characteristic

Condition

Min

Typical

Max

Unit
RAS Source impedance at input2 -   - - kW
VAIN Analog input voltage3 - VREFL - VREFL V
RES Ideal resolution (1 LSB)4 2.08V < VDDAD < 3.6V 2.031 - 3.516 mV
DNL Differential non-linearity5 - - ±0.5 ±1.0 LSB
INL Integral non-linearity6 - - ±0.5 ±1.0 LSB
EZS Zero-scale error7 - - ±0.4 ±1.0 LSB
FFS Full-scale error8 - - ±0.4 ±1.0 LSB
EIL Input leakage error9 - - ±0.05 ±5.0 LSB
ETU Total unadjusted error10 - - ±1.1 ±2.5 LSB

  1. All accuracy numbers are based on the processor and system being in WAIT state (very little activity and no I/O switching) and that adequate low-pass filtering is present on analog input pins (filter with 0.01 µF to 0.1 µF capacitor between analog input and VREFL). Failure to observe these guidelines may result in system or microcontroller noise causing accuracy errors which will vary based on board layout and the type and magnitude of the activity. Data transmission and reception during data conversion may cause some degradation of these specifications, depending on the number and timing of packets. We advise testing the ADCs in your installation if best accuracy is required.

  2. RAS is the real portion of the impedance of the network driving the analog input pin. Values greater than this amount may not fully charge the input circuitry of the ATD resulting in accuracy error.

  3. Analog input must be between VREFL and VREFH for valid conversion. Values greater than VREFH will convert to $3FF.

  4. The resolution is the ideal step size or 1LSB = (VREFH–VREFL)/1024.

  5. Differential non-linearity is the difference between the current code width and the ideal code width (1LSB). The current code width is the difference in the transition voltages to and from the current code.

  6. Integral non-linearity is the difference between the transition voltage to the current code and the adjusted ideal transition voltage for the current code. The adjusted ideal transition voltage is (Current Code–1/2)*(1/((VREFH+EFS)–(VREFL+EZS))).

  7. Zero-scale error is the difference between the transition to the first valid code and the ideal transition to that code. The Ideal transition voltage to a given code is (Code–1/2)*(1/(VREFH–VREFL)).

  8. Full-scale error is the difference between the transition to the last valid code and the ideal transition to that code. The ideal transition voltage to a given code is (Code–1/2)*(1/(VREFH–VREFL)).

  9. Input leakage error is error due to input leakage across the real portion of the impedance of the network driving the analog pin. Reducing the impedance of the network reduces this error.

  10. Total unadjusted error is the difference between the transition voltage to the current code and the ideal straight-line transfer function. This measure of error includes inherent quantization error (1/2LSB) and circuit error (differential, integral, zero-scale, and full-scale) error. The specified value of ETU assumes zero EIL (no leakage or zero real source impedance).